Hi,
Referring https://github.com/ARM-software/arm-trusted-firmware/blob/master/docs/getti…
it says : ``FAULT_INJECTION_SUPPORT``: ARMv8.4 extensions introduced support for fault injection from lower Els.
Referring https://github.com/ARM-software/arm-trusted-firmware/blob/master/lib/el3_ru…
FAULT_INJECTION_SUPPORT enables FIEN bit.
#if FAULT_INJECTION_SUPPORT
/* Enable fault injection from lower ELs */
scr_el3 |= SCR_FIEN_BIT;
#endif
Question :
1.
Do we have any relevant documentation from arm which specifies FIEN bit can be enabled from armv8.4 ?
2.
In cortex a-53 technical reference manual, SCR_EL3 does not have FIEN bit , bit 21 is marked reserved .
In cortex a-78 technical reference manual , manual does not have details for SCR_EL3 .
I want to know whether on Armv8.2-a based cores like cortex a-78 , is the FIEN bit field marked reserved in SCR_EL3 register or is available functionality wise as in armv8.4 ?
Please help with above query.
Regards
Amit
Hi,
Please find the latest report on new defect(s) introduced to ARM-software/arm-trusted-firmware found with Coverity Scan.
2 new defect(s) introduced to ARM-software/arm-trusted-firmware found with Coverity Scan.
14 defect(s), reported by Coverity Scan earlier, were marked fixed in the recent build analyzed by Coverity Scan.
New defect(s) Reported-by: Coverity Scan
Showing 2 of 2 defect(s)
** CID 425813: Memory - corruptions (OVERRUN)
/drivers/arm/css/dsu/dsu.c: 133 in cluster_on_dsu_pmu_context_restore()
________________________________________________________________________________________________________
*** CID 425813: Memory - corruptions (OVERRUN)
/drivers/arm/css/dsu/dsu.c: 133 in cluster_on_dsu_pmu_context_restore()
127 void cluster_on_dsu_pmu_context_restore(void)
128 {
129 unsigned int cluster_pos;
130
131 cluster_pos = (unsigned int) plat_cluster_id_by_mpidr(read_mpidr_el1());
132
>>> CID 425813: Memory - corruptions (OVERRUN)
>>> "&cluster_pmu_context[cluster_pos]" evaluates to an address that is at byte offset 138720 of an array of 544 bytes.
133 restore_dsu_pmu_state(&cluster_pmu_context[cluster_pos]);
** CID 425812: Memory - corruptions (OVERRUN)
/drivers/arm/css/dsu/dsu.c: 81 in cluster_off_dsu_pmu_context_save()
________________________________________________________________________________________________________
*** CID 425812: Memory - corruptions (OVERRUN)
/drivers/arm/css/dsu/dsu.c: 81 in cluster_off_dsu_pmu_context_save()
75 void cluster_off_dsu_pmu_context_save(void)
76 {
77 unsigned int cluster_pos;
78
79 cluster_pos = (unsigned int) plat_cluster_id_by_mpidr(read_mpidr_el1());
80
>>> CID 425812: Memory - corruptions (OVERRUN)
>>> "&cluster_pmu_context[cluster_pos]" evaluates to an address that is at byte offset 138720 of an array of 544 bytes.
81 save_dsu_pmu_state(&cluster_pmu_context[cluster_pos]);
82 }
83
84 /*****************************************************************************
85 * This function, restore_dsu_pmu_state, restores the state of the
86 * Performance Monitoring Unit (PMU) from a previously saved state.
________________________________________________________________________________________________________
To view the defects in Coverity Scan visit, https://u15810271.ct.sendgrid.net/ls/click?upn=u001.AxU2LYlgjL6eX23u9ErQy-2…
Hi,
Please find the latest report on new defect(s) introduced to ARM-software/arm-trusted-firmware found with Coverity Scan.
1 new defect(s) introduced to ARM-software/arm-trusted-firmware found with Coverity Scan.
8 defect(s), reported by Coverity Scan earlier, were marked fixed in the recent build analyzed by Coverity Scan.
New defect(s) Reported-by: Coverity Scan
Showing 1 of 1 defect(s)
** CID 425810: High impact quality (WRITE_CONST_FIELD)
/plat/nxp/s32/s32g274ardb2/plat_console.c: 17 in console_s32g2_register()
________________________________________________________________________________________________________
*** CID 425810: High impact quality (WRITE_CONST_FIELD)
/plat/nxp/s32/s32g274ardb2/plat_console.c: 17 in console_s32g2_register()
11
12 void console_s32g2_register(void)
13 {
14 static console_t s32g2_console;
15 int ret;
16
>>> CID 425810: High impact quality (WRITE_CONST_FIELD)
>>> A write to an aggregate overwrites a const-qualified field within the aggregate.
17 (void)memset(&s32g2_console, 0, sizeof(s32g2_console));
18
19 ret = console_linflex_register(UART_BASE, UART_CLOCK_HZ,
20 UART_BAUDRATE, &s32g2_console);
21 if (ret == 0) {
22 panic();
________________________________________________________________________________________________________
To view the defects in Coverity Scan visit, https://u15810271.ct.sendgrid.net/ls/click?upn=u001.AxU2LYlgjL6eX23u9ErQy-2…